Semiconductor devices. Mechanical and climatic test methods - Latch-up test Ingestion-build-180956 Contents of BS ISO/IEC 19793:

Contents of BS ISO/IEC 19793:

This British Standard is the UK implementation of EN 12620:2013

as amended

BS EN 16140 describes an adapted thermal shock test for stones with finely dispersed

Semiconductor devices. Mechanical and climatic test methods - Latch-up test Ingestion-build-180956 Contents of BS ISO/IEC 19793:What is BS EN 60749 29 Latch up test of integrated circuits for semiconductor devices about? BS EN 60749 29 is the 29th part of an international standard used for semiconductor devices that specifies the test method for integrated circuits. By using BS EN 60749 29 you can manufacture good quality semiconductor devices. BS EN 60749 29 covers the I test and the overvoltage latch up testing of integrated circuits. This test is classified as destructive.