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Semiconductor devices. Micro-electromechanical devices - Bend testing methods of thin film materials Ingestion-build-264231 It is applicable to piping

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It is applicable to piping systems intended for the supply of water under pressure up to and including 25 °C (cold water) intended for human consumption and for general purposes as well as for waste water under pressure

Manufacturers of equipment and components of liquid cooling systems

Who is BS 6701 for

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Semiconductor devices. Micro-electromechanical devices - Bend testing methods of thin film materials Ingestion-build-264231 It is applicable to piping1 Scope This part of IEC 62047 specifies the method for bend testing of thin film materials with a length and width under 1 mm and a thickness in the range between 0,1 m and 10 m. Thin films are used as main structural materials for Micro electromechanical Systems (abbreviated as MEMS in this document) and micromachines. The main structural materials for MEMS, micromachines, etc., have special features, such as a few micron meter size, material

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