Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-93833 ISBN 0 580 39852 8

ISBN 0 580 39852 8

Together with BS EN 81-20:2014

all pressures are relative pressures expressed in bars

BS ISO/IEC 19784-1:2006+A3:2010 Information technology

Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-93833 ISBN 0 580 39852 8What is BS EN IEC 6074917 about? BS EN IEC 6074917 is the 17th part of an international standard that covers the attributes of semiconductor devices. This specifies the neutron irradiation test method for determining the degradation parameters of critical semiconductor devices. BS EN IEC 6074917 specifies the neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non ionizing energy loss (NIEL) degradation.