Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 Part 1 of BS ISO/IEC

Part 1 of BS ISO/IEC 7816 applies to cards which have a physical interface with electrical contacts

such as titanium

This document is not intended for the purpose of taking a decision whether an incident is reportable or not

acceptance of the screening file alone is not deemed to have met the requirements of this standard

Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation Ingestion-build-135476 Part 1 of BS ISO/IECWhat is this standard about? The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military and aerospace related applications. It is a destructive test. The objectives of the test are as follows: a) to detect and measure the degradation of