Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level has-hardcopy When a tyre is no

When a tyre is no longer safe or efficient to reuse

• equipment in close proximity to receiving antennas

BS EN 15518-2:2011 Winter maintenance equipment

are tested in a tensile testing machine after air conditioning or soaking with water

Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level has-hardcopy When a tyre is no1 Scope This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto electronic devices, hybrid integrated circuits (HICs), and