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GB/T 2423.34-2024 Chinese PDF (GB/T2423.34-2024) GB/T 2879-2024 English versions: GB/T 45646-2025
GB/T 2423.34-2024 Chinese PDF (GB/T2423.34-2024) GB/T 2879-2024 English versions: GB/T 45646-2025
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Description
English versions: GB/T 45646-2025
English versions: GB/T 42126
GB/T 26189
GB/T 43315-2023_Chinese: Test method for flow pattern defects in silicon wafer - Etching technique (Chinese: 硅片流动图形缺陷的检测 腐蚀法)
GB/T 2423.34-2024 Chinese PDF (GB/T2423.34-2024) GB/T 2879-2024 English versions: GB/T 45646-2025GB T 2423. 34 2024_Chinese: Environmental testing Part 2: Test methods Test Z AD: Composite temperature humidity cyclic test (Chinese: 2 Z AD: ) Note Careful: Text of PDF is in Chinese (not English). Delivery (PDF in Chinese): 2 working hours typically, ASAP English versions: GB T 2423. 34 2024
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