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M03200 - SEMI M32 - Guide to Statistical Specifications StdTpc-Package Test Methods このガイドは,3つの重要な方法を使用するラフネスの決定に関する用語および手順を提供する。
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Description
このガイドは,3つの重要な方法を使用するラフネスの決定に関する用語および手順を提供する。
This Document references SEMI E78
SEMI F81 — Specification for Visual Inspection and Acceptance of Gas Tungsten Arc (GTA) Welds in Fluid Distribution Systems in Semiconductor Applications
1 EtherNet/IP is a communication system suitable for use in industrial environments
M03200 - SEMI M32 - Guide to Statistical Specifications StdTpc-Package Test Methods このガイドは,3つの重要な方法を使用するラフネスの決定に関する用語および手順を提供する。This standard was technically approved by the global Silicon Wafer Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on November 21, 2006. It was available at www. semi. org in February 2007. Originally published September 1998; previously published July 2004. Specifications are based on requirements negotiated between trading partners. This document describes an explicit specification form that defines
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