M02900 - SEMI M29 - Specification for 300 mm Shipping Box StdPbc-0912 With reduced precision

With reduced precision

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This symbol is included to provide for a smooth transition from existing traceability and labeling procedures to the comprehensive

Also covered is a procedure for detecting the presence of p-n junctions in the subsurface region of bulk or epitaxial silicon

M02900 - SEMI M29 - Specification for 300 mm Shipping Box StdPbc-0912 With reduced precisionThis specification was technically approved by the global Silicon Wafer Committee and is the direct responsibility of the Japanese Silicon Wafer Committee. Current edition approved by the Japanese Regional Standards Committee on August 8, 2003. Initially available at www. semi. org September 2003; to be published November 2003. Originally published December 1996. This specification defines a container for safe transportation of 300 mm wafers from a