M01200 - SEMI M12 - Specification for Serial Alphanumeric Marking of Silicon Wafers StdPbc-1025 Although this Test Method is

Although this Test Method is generally nonselective

SEMI D53-0708 (first published)

and research and development

Process technology used in the manufacture of semiconductors and electronic devices continues to achieve increases in active feature density and device complexity

M01200 - SEMI M12 - Specification for Serial Alphanumeric Marking of Silicon Wafers StdPbc-1025 Although this Test Method isThis Specification describes a coded alphanumeric marking of silicon or other semiconductor wafers. The wafer alphanumeric code links the properties of the wafer stored in an appropriate database system to each individual wafer for purposes of tracking and control during wafer and device manufacture. Use of this Specification ensures the consistency of all wafers marking performed by silicon manufacturers. This consistency allows simplification of the