HB01400 - SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate Revision:SEMI HB14-0223 - Current The user should investigate metrology

The user should investigate metrology suppliers’ current capabilities

SEMI E179-0322 (technical revision)

This Standard will be helpful to unify terminologies used for backlight units

This Standard provides specification for interconnection dimensions and performance requirements for permanent microfluidic interfaces

HB01400 - SEMI HB14 - Test Method for Determining Geometrical Parameters of Patterns on Patterned Sapphire Substrate Revision:SEMI HB14-0223 - Current The user should investigate metrologyBecause there are various requirements and measurement methods for patterned sapphire substrate (PSS) in the LED industry, a standardized measurement method of PSS needs to be established so that customers and PSS suppliers can work together smoothly. It is necessary to establish a standardized measurement method of PSS so that PSS suppliers will be able to provide clear and consistent product information to customers. Provides a measurement method