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G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes Revision:SEMI G52-1120 - Current SEMI E16-90 (Reapproved 0699)
G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes Revision:SEMI G52-1120 - Current SEMI E16-90 (Reapproved 0699)
$193.00
Description
SEMI E16-90 (Reapproved 0699)
originally published in 1995
1 This Standard is to design and implement the measurement method of color breakup
SEMI M57-0305 (complete rewrite)
G05200 - SEMI G52 - Test Method for Measurement of Ionic Contamination on Semiconductor Leadframes Revision:SEMI G52-1120 - Current SEMI E16-90 (Reapproved 0699)Contamination on leadframes can contribute to semiconductor device reliability problems. This Test Method may be used by lead frame manufacturers at outgoing inspection and by users at incoming inspection. Correlation of device reliability with contamination levels may lead to improved leadframe cleaning processes. This Standard describes the procedure to determine ionic contamination on leadframes using a water extraction method. The method is
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